Ion-tof公司

Author: rpge

August undefined, 2024

Web13 apr. 2024 · 南京某科技公司将Vzense RGB-D ToF相机集成在军事考核评分系统中，用于检测士兵体能达标状况。应用案例六. 牛羊数量检测. Vzense ToF相机在畜牧业养殖方 … WebUltra-high transmission for optimized molecular sensitivity and monolayer analysis High speed (> 8 kHz) TOF-SIMS (MS 1) and tandem MS (MS 2) imaging High resolution (< 100 nm) TOF-SIMS (MS 1) and tandem MS …

Time-of-Flight Secondary Ion Mass Spectrometry NIST

Web29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … The basic instrument is equipped with a reflectron TOF analyser giving high … Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … Service - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... http://www.iontof.com.cn/bk_16938892.html first oriental market winter haven menu

国内有哪些做dTof芯片的企业？ - 知乎

Web刘看山知乎指南知乎协议知乎隐私保护指引应用工作申请开通知乎机构号侵权举报网上有害信息举报专区京 icp 证 110745 号京 icp 备 13052560 号 - 1 京公网安备 … http://www.iontof.com.cn/ WebTime-of-Flight Secondary Ion Mass Spectrometry Summary Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular ions with mass-to-charge ratios ranging from m/z 1 to m/z 10,000 in a single spectrum. first osage baptist church

Time Of Flight Mass Spectrometer Components from Jordan TOF …

WebOur Time Of Flight (TOF) mass spectrometer components are designed to generate, store, separate and detect ions. They are designed to be used as components in specialized … WebThe positive and negative spectra for each sample were acquired using TOF-SIMS.5 (ION-TOF GmbH, Münster) with 60 keV Bi 3 2+, current of 0.2 pA, as a primary ion beam and a 10 keV Ar 1000 +, current of 2 nA, as a sputtering beam. 16 The analysis area was 100 × 100 μm 2, with a pixel density of 128 × 128, and the sputtering area was 500 × ... first orion at\u0026tWeb主流的ToF相机厂商包括pmd、ams、ST、TI、Infineon、Sony、Optrima、微软等少数几家，其中pmd是一家能够提供户内、户外均能使用的ToF相机厂商，其产品具备多种探测距离，可适用于科研、工业和消费电子等多种场合；Optrima和微软的ToF相机主要面向家庭、娱乐应用，价格相对较低。 Pmd与Infineon Pmd的总部位于德国锡根，且在美国圣荷西、 … firstornull

"WebAbout IONTOF GmbH: IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry … " - Ion-tof公司

Ion-tof公司

IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ...

WebToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples. A pulsed, … Web2.3. ToF-SIMS 和Rf-GDOES深度剖析 ToF-SIMS 和Rf-GDOES 设备分别是德国ION-ToF 公司的ION-ToF SIMS 5和法国Horiba 公司的 GD-Profiler2。ToF-SIMS 深度剖析的工作参数为：2keV O 2 +溅射离子，30keVBi+为二次离子源，束流强

Did you know?

WebIONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry) - LEIS (low energy ion scattering). Ion beam technology products for surface spectrometry, surface analysis, depth profiling, surface imaging, 3D analysis, … Web24 mrt. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the …

WebIONTOFジャパン株式会社 Your NEW Partner for Surface Analysis 2024年4月始動！ M6 - SIMS technology one step ahead M6 は、IONTOF社が提案する最新世代の TOF-SIMS です。最新のイオン銃およびアナライザーを搭載し、分析性能、操作性が大きく向上しました。あらゆる分野の分析ニーズに対応し、産業および学術研究に理想的な製品です。 … Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering spectroscopy (iss). Company for products for surface analysis, surface spectrometry, surface imaging, depth profiling, retrospective analysis and 3D analysis

Web为了进一步简化谱图数据处理，IONTOF 为 M6 提供了各种工具，例如质谱图库，完全集成的多元统计分析（MVSA）软件包，以及强大性能的 Q ExactiveTM 功能扩展。 M6 TOF … WebThe TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF Company. Its design guarantees optimum performance in all fields of SIMS applications. The instruments offers three ion sources offering Bi1–7+, Cs+ and O2+ and is equipped with a reflectron TOF analyzer giving high secondary ion transmission with ...

Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering …

first original 13 statesWeb19 jan. 2024 · Specifically with a huge cluster ion beam such as Ar cluster ions, TOF-SIMS provides organic depth profiles in detail, which is powerful not only for organic and polymer science fields but also for biological fields. However, secondary ionization by TOF-SIMS is often a problem in quantitative analysis due to the matrix effects 1–14 1. R. G. firstorlando.com music leadershipWeb北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理，成立于2012年。公司成员来自北京大学、中科院物理所等一流院校研究生。主要负责中国大陆及港澳地区的销售、 … first orlando baptisthttp://rmjordan.com/ firstorlando.comWebIONTOF GmbH Heisenbergstr.15 48149 Münster Germany www.iontof.com Registergericht: Amtsgericht Münster, HRB 10680 Geschäftsführer: Dr. Ewald Niehuis Website … first or the firstWeb我司作为德国ion-tof公司的中国总代理，成立于2012年。主要负责中国大陆及港澳地区的销售、售后、宣传、技术培训等工作。公司成员来自北京大学、中科院物理所等一流院校 … first orthopedics delawareWeb德国ion tof公司是目前国际tof-sims仪器主要生产商。 2003年，德国ion tof公司研发了第五代tof-sims仪器。 2005年，德国ion tof公司推出第一代bi源。 2010年，德国ion tof公司 … first oriental grocery duluth